Lab for Thin Films - Nanobiomaterials - Nanosystems - Nanometrology

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Publications 2001

  1. "Crystallization effects and diamond formation in amorphous carbon films under low energy ion beam irradiation''
    P. Patsalas, S. Logothetidis
    Nucl. Istr. Meth. B 178 1-4, 247-251(2001)
  2. "Correlation of hardness, elastic modulus and density measurements by nanoindentation and ultrasonic surface acoustic wave techniques on magnetron sputtered TiAIBN coatings"
    C.Rebholz, A.Leyland, D. Schneider, B.Schultrich, C.Charitidis, S.Logothetidis and A.Matthews.
    Thin Solid Films (in press)
  3. "Study of the bonding structure of carbon nitride films by IR spectroscopic ellipsometry"
    A.Laskarakis, S. Logothetidis and M.Gioti
    Phys. Rev. B 64 (12) (2001)
  4. "Real-time monitoring, growth kinetics and properties of carbon based materials deposited by sputtering"
    S. Logothetidis, M. Gioti, P. Patsalas
    Diam Relat. Mater. 10, 117 (2001)
  5. "Structural, electrical and low frequency noise properties of amorphous carbon-silicon heterojunctions"
    N.A. Hastas, C.A. Dimitriadis, P. Patsalas, Y. Panayiotatos, D.H. Tassis and S. Logothetidis
    J. Appl. Phys. 89 2832(2001)
  6. "A study on the bonding structure and mechanical properties of magnetron sputtered CNx thin films"
    A. Laskarakis, S. Logothetidis, C. Charitidis, M. Gioti, Y. Panayiotatos, M. Handrea and W. Kautek
    Diam. Relat. Mater.10, 1179 (2001)
  7. "A complementary study of bonding and electronic structure of amorphous carbon films by electron spectroscopy and optical techniques"
    P. Patsalas, M. Handrea, S. Logothetidis, M. Gioti, S. Kennou and W. Kautek
    Diam. Relat. Mater.10, 960 (2001)
  8. "Temperature dependence of the barrier at the tetrahedral amorphous carbon-silicon interface"
    N.A.Hastas, C.A.Dimitriadis, S.Logothetidis, C.T.Angelis, N.Konofaos, and E.K.Evangelou
    Semiconductor Science & Technology, 16, 474 (2001)
  9. "Electrical characterization of TiN/a-C/Si devices grown by magnetron sputtering at room temperature"
    N.Konofaos, C.T.Angelis, E.K.Evangelou, Y.Panayiotatos, C.A.Dimitriadis, and S.Logothetidis
    Appl. Phys. Lett 78(12), 1649 (2001)
  10. "Microstructure and its effect on the conductivity of magnetron sputtered carbon thin films"
    C.A.Dimitriadis, N.A.Hastas, N. Vouroutzis, S.Logothetidis, and Y.Panayiotatos
    J. Appl. Phys. 90, 1 (2001)
  11. "Electrical characterization of nanocrystalline carbon on crystalline silicon heterojunctions"
    N.A.Hastas, D.H.Tassis, C.A.Dimitriadis, S.Logothetidis, and Y. Panayiotatos
    Appl. Phys. Lett. (submitted)
  12. "Optical, Electronic and Transport Properties of Nanocrystalline Titanium Nitride Thin Films"
    P. Patsalas, and S. Logothetidis
    J. Appl. Phys. 90, 9 (2001)
  13. "Charge carrier lifetime in sputtered a-C/n-Si heterojunctions"
    N. Konofaos, C.T. Angelis, E.K. Evangelou, C.A. Dimitriadis, and S. Logothetidis
    Appl. Phys. Lett. 79,15 (2001)
  14. "High-field transport and noise properties of sputter-deposited amorphous carbon films with different thickness"
    N.A. Hastas, C.A. Dimitriadis, Y. Panayiotatos, D.H. Tassis, S. Logothetidis, D. Papadimitriou, G. Roupakas, and G. Adamopoulos
    J. Appl. Phys. (submitted)
  15. "In-situ and real-time ellipsometry diagnostic techniques towards the monitoring of the bonding structure and growth kinetics: silicon oxide coatings"
    S. Logothetidis, A. Laskarakis, P. Patsalas, and A. Gika
    Surf. Sci. and Techn., in press (2001)

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